Christian Faber
Faculty of Electrical Engineering and Industrial Engineering, Landshut University of Applied Sciences
Hochschule Landshut, Landshut University of Applied Sciences
Sensor Technology and Image Processing, Landshut University of Applied Sciences
Institute of Optics, Information and Photonics, Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU)
Chair of Optics, OSMIN Group, Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU)
40 papers
A2 · Talk · 127. Conference (2026)
Deflectometric Measurement of Astronomical Mirrors: Comparison of Different Calibration and Evaluation Methods
S1 · Invited Talk · 127. Conference (2026)
Limits in Optics – How to Bargain with Nature
H4 · Keynote · 126. Conference (2025)
From differentiable modelling to system optimization: The full journey using Geometric Algebra exemplarily applied to improve light sectioning systems
B1 · Talk · 125. Conference (2024)
The anycentric camera: A unifying pinhole model for ento-, hyper- and telecentric lenses using Geometric Algebra
B8 · Talk · 124. Conference (2023)
Combining simulation and optimization: Multipurpose modelling of camera-based optical metrology systems
A21 · Talk · 123. Conference (2022)
Shedding new light on ray tracing for optical metrology systems by using Geometric Algebra
A24 · Talk · 122. Conference (2021)
Ein neuer Ansatz für den Phase-Unwrap bei der monokularen phasenmessenden Single-Shot Deflektometrie
A14 · Talk · 121. Conference (2020)
Ein neuer Ansatz für den Phase-Unwrap bei der monokularen phasenmessenden Single-Shot Deflektometrie
P7 · Poster · 121. Conference (2020)
Lokalisierte Single-Shot-Auswertung für die phasenmessende Deflektometrie mit Wavelet Transformation
A12 · Talk · 120. Conference (2019)
Inverse Streifenprojektion kombiniert mit Wavelet-Transformation als optische Inline-Inspektionslösung in der Umformtechnik
B14 · Talk · 120. Conference (2019)
Eine neue Methode zur Lösung des Höhenproblems in der Deflektometrie
B27 · Talk · 119. Conference (2018)
Frequenzcodierte Deflektometrie
P1 · Poster · 119. Conference (2018)
On-the-Fly-Deflektometrie zur schnellen 3D-Inline-Inspektion in der Bewegung
P2 · Poster · 119. Conference (2018)
Optimierte Erzeugung eines inversen Streifenmusters für die Inline-3D-Inspektion in der Umformtechnik
A21 · Talk · 118. Conference (2017)
Linienintegration eines Single-Shot-3D-Sensors in einer Saugerbalken-Presse
B11 · Talk · 118. Conference (2017)
Das Beste aus zwei Welten: Fusion von Phasenmessender Deflektometrie und Shape from Specular Flow
B15 · Talk · 118. Conference (2017)
Vergleich von modellfreier und modellbasierter Kalibrierung eines Lichtschnittsensors mit allgemeiner applikationsspezifischer Beleuchtungsoptik
B2 · Talk · 117. Conference (2016)
Inline detection of defects on free formed metal pressings using a single shot inverse fringe projection approach
B6 · Talk · 117. Conference (2016)
Easy field-applicable calibration of a miniaturized light sectioning sensor with application-specific illumination optics
A2 · Talk · 114. Conference (2013)
Accurate Deflectometry for non-cooperative Applications
A16 · Talk · 114. Conference (2013)
Tomographic Triangulation
A8 · Talk · 113. Conference (2012)
Why can't we purchase a perfect single shot 3D-sensor?
A25 · Talk · 113. Conference (2012)
Compact PMD measurement and PSF reconstruction for large mirrors
P28 · Poster · 113. Conference (2012)
Object reconstruction by deflectometry
P29 · Poster · 113. Conference (2012)
Kill two birds with one stone - measure shape and reflectivity at the same time
A1 · Talk · 112. Conference (2011)
Phase-Shift vs. Line-Shift: Two ways to do Deflectometry
A3 · Talk · 112. Conference (2011)
Deflektometrische Selbstkalibrierung für spiegelnde Objekte
A6 · Talk · 112. Conference (2011)
Full-field macroscopic measurement of specular, curved surfaces with SIM
P27 · Poster · 112. Conference (2011)
Deflectometric Measurement of 10,000 Telescope Mirror Tiles
P28 · Poster · 112. Conference (2011)
Deflectometry for Ultra Precision Machining - Measuring without Rechucking
P36 · Poster · 112. Conference (2011)
Driving Structured-Illumination Microscopy towards the Limits of Efficiency and Accuracy
A18 · Talk · 111. Conference (2010)
Algorithmic Elimination of Parasitic Reflections in Deflectometry
A19 · Talk · 111. Conference (2010)
UV-Deflectometry: No parasitic reflections
A22 · Talk · 111. Conference (2010)
Tuning Structured Illumination Microscopy (SIM) for the Inspection of Micro Optical Components
P9 · Poster · 111. Conference (2010)
Information efficient and accurate Structured Illumination Microscopy (SIM)
P33 · Poster · 111. Conference (2010)
New Holistic Self-Calibration Method for Deflectometric Sensors
A10 · Talk · 110. Conference (2009)
Can deflectometry work in presence of parasitic reflections?
A12 · Talk · 110. Conference (2009)
3D-microscopy with large depth of field
P23 · Poster · 110. Conference (2009)
Object tilt - a source of systematic error in transmission deflectometry
P24 · Poster · 110. Conference (2009)