Micro-deflectometry in transmission

Sandy Peterhänsel, Claus Richter, Christian Faber, Markus Knauer, Gerd Häusler
  1. Institut für Optik, Information und Photonik, Friedrich-Alexander-Universität Erlangen-Nürnberg

speterhaensel [at] optik [dot] uni-erlangen [dot] de

We present a novel microscopic method that intrinsically measures local phase gradients of transparent objects. The method is based on "phase measuring deflectometry" [1] in transmission. Images similar to those achieved with differential interference contrast or with phase contrast are generated. However, the novel method displays some additional new features: the images display quantitative data about the lateral variation of the optical path length; the sensitivity reaches the physical limit: very small variations of the refractive index can be measured . Moreover, the method is simple (no interference !). Micro-deflectometry in transmission has the potential to compete with established methods to acquire phase object information.

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@inproceedings{peterhaensel2009p24,
  author     = {Peterhänsel, Sandy and Richter, Claus and Faber, Christian and Knauer, Markus and Häusler, Gerd},
  title      = {{Micro-deflectometry in transmission}},
  booktitle  = {DGaO-Proceedings 2009},
  series     = {DGaO-Proceedings},
  eventtitle = {110. Jahrestagung der DGaO},
  eventdate  = {2009-06-02/2009-06-05},
  venue      = {Brescia},
  publisher  = {Deutsche Gesellschaft für angewandte Optik e.V.},
  year       = {2009},
  pages      = {P24},
  url        = {https://dgao-proceedings.de/paper/110-p24}
}
110. Jahrestagung der DGaO · Brescia · 2009