Lensless white light interferometry for technical surfaces

Justin Bich; André Battling; Ralf B. Bergmann; Claas Falldorf

doi:10.83229/127-b021

Vortrag B21

Lensless white light interferometry for technical surfaces

Justin Bich¹, André Battling¹, Ralf B. Bergmann^1,2, Claas Falldorf^1,2

1BIAS - Bremer Institut für angewandte Strahltechnik GmbH
2Fachbereich 01: Physik und Elektrotechnik / MAPEX Center for Materials and Processes, Universität Bremen

bich [at] bias [dot] de

Lensless white light interferometry (WLI) based on digital holography enables lightweight and compact measurement systems. Compared to conventional WLI, it allows larger fields of views, reduces the number of images required and thus measurement time and sensitivity to vibration. The method allows in-process applications with interferometric axial resolution.

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@inproceedings{bich2026b21,
  author     = {Bich, Justin and Battling, André and Bergmann, Ralf B. and Falldorf, Claas},
  title      = {{Lensless white light interferometry for technical surfaces}},
  booktitle  = {DGaO-Proceedings 2026},
  series     = {DGaO-Proceedings},
  eventtitle = {127. Jahrestagung der DGaO},
  eventdate  = {2026-05-27/2026-05-29},
  venue      = {Hamburg},
  publisher  = {Deutsche Gesellschaft für angewandte Optik e.V.},
  year       = {2026},
  pages      = {B21},
  langid     = {english},
  doi        = {10.83229/127-b021},
  url        = {https://dgao-proceedings.de/paper/127-b21}
}

127. Jahrestagung der DGaO · Hamburg · 2026

DOI: 10.83229/127-b021