DGaO·Proceedings ISSN 1614-8436
DE
Talk B21

Lensless white light interferometry for technical surfaces

Justin Bich1, André Battling1, Ralf B. Bergmann1,2, Claas Falldorf1,2
  1. 1BIAS - Bremer Institut für angewandte Strahltechnik GmbH, Bremen Institute for Applied Beam Technology
  2. 2Faculty 01: Physics and Electrical Engineering / MAPEX Center for Materials and Processes, University of Bremen

bich [at] bias [dot] de

Lensless white light interferometry (WLI) based on digital holography enables lightweight and compact measurement systems. Compared to conventional WLI, it allows larger fields of views, reduces the number of images required and thus measurement time and sensitivity to vibration. The method allows in-process applications with interferometric axial resolution.

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@inproceedings{bich2026b21,
  author     = {Bich, Justin and Battling, André and Bergmann, Ralf B. and Falldorf, Claas},
  title      = {{Lensless white light interferometry for technical surfaces}},
  booktitle  = {DGaO-Proceedings 2026},
  series     = {DGaO-Proceedings},
  eventtitle = {127. Jahrestagung der DGaO},
  eventdate  = {2026-05-27/2026-05-29},
  venue      = {Hamburg},
  publisher  = {Deutsche Gesellschaft für angewandte Optik e.V.},
  year       = {2026},
  pages      = {B21},
  langid     = {english},
  doi        = {10.83229/127-b021},
  url        = {https://dgao-proceedings.de/paper/127-b21}
}
127. Annual Conference of the DGaO · Hamburg · 2026
DOI: 10.83229/127-b021