M. C. Seraphim

Institute of Optics, Information and Photonics, Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU)

5 papers

A18 · Talk · 111. Conference (2010)

Algorithmic Elimination of Parasitic Reflections in Deflectometry

C. Faber, M. C. Seraphim, D. Sprenger, G. Häusler

A19 · Talk · 111. Conference (2010)

UV-Deflectometry: No parasitic reflections

D. Sprenger, C. Faber, M. C. Seraphim, G. Häusler

A22 · Talk · 111. Conference (2010)

Tuning Structured Illumination Microscopy (SIM) for the Inspection of Micro Optical Components

M. Vogel, A. Kessel, Z. Yang, C. Faber, M. C. Seraphim, G. Häusler

P9 · Poster · 111. Conference (2010)

Information efficient and accurate Structured Illumination Microscopy (SIM)

A. Kessel, M. Vogel, Z. Yang, C. Faber, M. C. Seraphim, G. Häusler

P33 · Poster · 111. Conference (2010)

New Holistic Self-Calibration Method for Deflectometric Sensors

E. Olesch, C. Faber, M. C. Seraphim, G. Häusler