Speckle-Based Relative Wavelength Measurements – A Cost-Effective Alternative
- 1Carl Zeiss AG
- 2Institut für Technische Optik, Universität Stuttgart
niklas [dot] borchers [at] zeiss [dot] com
Highly accurate relative wavelength changes can be determined from speckle shifts using a simple setup that illuminates a rough surface and records the speckle pattern at a high angle. The standard deviation of the measured wavelength residuals compared to a commercial Fizeau-type wavemeter was reduced by introducing a multi-ROI evaluation scheme from 65 fm to 35 fm over a tuning range of 0.3 nm. The speckle-shift-based wavelength sensor could therefore replace conventional wavemeters in certain use cases.
@inproceedings{borchers2026a7,
author = {Borchers, Niklas and Böhm, Sebastian and Vogl, Ulrich and Glasenapp, Carsten and Haist, Tobias and Reichelt, Stephan},
title = {{Speckle-Based Relative Wavelength Measurements – A Cost-Effective Alternative}},
booktitle = {DGaO-Proceedings 2026},
series = {DGaO-Proceedings},
eventtitle = {127. Jahrestagung der DGaO},
eventdate = {2026-05-27/2026-05-29},
venue = {Hamburg},
publisher = {Deutsche Gesellschaft für angewandte Optik e.V.},
year = {2026},
pages = {A7},
langid = {english},
doi = {10.83229/127-a007},
url = {https://dgao-proceedings.de/paper/127-a7}
}
127. Jahrestagung der DGaO · Hamburg · 2026
DOI: 10.83229/127-a007