Christian Koos

Institute of Microstructure Technology, Karlsruhe Institute of Technology (KIT)
Institute of Photonics and Quantum Electronics, Karlsruhe Institute of Technology (KIT)
Karlsruhe Institute of Technology, Karlsruhe Institute of Technology (KIT)

9 papers

A4 · Talk · 116. Conference (2015)

High-precision laser ranging for industrial metrology with dual-color electro-optic frequency combs

C. Weimann, F. Hoeller, W. Freude, C. Koos
A1 · Talk · 115. Conference (2014)

Fast high-precision distance measurements with electro-optic frequency combs

C. Weimann, S. Wolf, D. Meier, Y. Schleitzer, M. Totzeck, A. Heinrich, F. Hoeller, W. Freude, C. Koos
A2 · Talk · 115. Conference (2014)

Kerr-Frequenzkämme und deren Stabilisierung für die Terabit-Kommunikation

J. Pfeifle, V. Brasch, P. C. Schindler, C. Weimann, Y. Yu, W. Freude, T. J. Kippenberg, C. Koos
A16 · Talk · 115. Conference (2014)

Polarization-Sensitive Optical Coherence Tomography for Characterization of Size and Shape of Nano-Particles

S. Schneider, A. Krämer, F. Eppler, H. Alemye, C. Hübner, I. Mikonsaari, W. Freude, C. Koos
B15 · Talk · 115. Conference (2014)

Lasing goblet resonators – active microstructures for integrated biosensors

S. Koeber, U. Bog, T. Wienhold, S. F. Wondimu, T. Mappes, F. Brinkmann, M. Hirtz, S. Wiegele, H. Kalt, C. Koos
H1 · Keynote · 115. Conference (2014)

Silicon Photonics, Hybrid Integration, and Frequency Combs: Technologies for Terabit/s Communications, Teratronics, and Optical Metrology

C. Koos, W. Freude, R. Palmer, M. Lauermann, S. Koeber, J. Pfeifle, C. Weimann P. C. Schindler, N. Lindenmann, T. Hoose, M. R. Billah
P24 · Poster · 115. Conference (2014)

Frequenzmultiplex-Verfahren für zukünftige optische Zugangsnetzwerke

P. C. Schindler, R. Schmogrow, M. Dreschmann, S. Wolf, J. Meyer, D. Hillerkuss, I. Tomkos, J. Prat, H.-G. Krimmel, T. Pfeiffer, P. Kourtessis, J. Becker, C. Koos, W. Freude, J. Leuthold
S8 · Invited Talk · 115. Conference (2014)

Silicon-Organic Hybrid (SOH) Devices for Applications in Optical Communications, Metrology, and Sensing

R. Palmer, M. Lauermann, C. Koos