Justin Bich

Optical Measurement Technology and Optoelectronic Systems, Bremen Institute for Applied Beam Technology

BIAS - Bremer Institut für angewandte Strahltechnik GmbH, Bremen Institute for Applied Beam Technology

2 papers

B21 · Talk · 127. Conference (2026)

J. Bich, A. Battling, R. B. Bergmann, C. Falldorf

B38 · Talk · 126. Conference (2025)

F. Thiemicke, J. Bich, R. B. Bergmann, C. Falldorf