The first optical distance sensor offering true nm-uncertainty

Lennino Cacace1, Willem Dirk van Amstel2, Ron Asjes3, Rens Henselmans4
  1. 1AC Optomechanix (Niederlande)
  2. 2WimOptik (Niederlande)
  3. 3SensoRon
  4. 4Niederländische Organisation für Angewandte Naturwissenschaftliche Forschung (TNO), Nederlandse Organisatie voor Toegepast Natuurwetenschappelijk Onderzoek (Niederlande)

l [dot] a [dot] cacace [at] ac-optomechanix [dot] com

Till now, every commercially available optical distance sensor does not (and fundamentally cannot) deliver nm-level uncertainty when measuring even slightly tilted surfaces, though spec sheets often suggest differently! The reason is that all common single point optical distance sensors suffer from strong tilt-dependency, resulting in measurement uncertainty in the µm-range, which is not good enough for ultra-precision CMMs and freeform measurement machines. Our sensor designs solve this problem by both preventing and correcting tilt dependent errors (patent pending), enabling tilt-robust measurements with nanometer-level uncertainty. Moreover, the proven response model allows us to match each sensor to specific measurement needs, and the primary range of 3 μm to 10 μm can be extended up to millimeters by addition of a servo and secondary measurement system while preserving nm-accuracy. As such, our sensor is applied in TNO's NANOMEFOS freeform optics measurement machine, enabling its state-of-the-art accuracy.

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@inproceedings{dgao113-p46, title = {The first optical distance sensor offering true nm-uncertainty}, author = {Lennino Cacace, Willem Dirk van Amstel, Ron Asjes, Rens Henselmans}, booktitle = {DGaO-Proceedings, 113. Jahrestagung}, year = {2012}, publisher = {Deutsche Gesellschaft für angewandte Optik e.V.}, issn = {1614-8436}, note = {Poster P46} }
113. Jahrestagung der DGaO · Eindhoven · 2012