Shekhar Kumar Patra

BIAS - Bremer Institut für angewandte Strahltechnik GmbH, Bremen Institute for Applied Beam Technology

1 paper

A11 · Talk · 121. Conference (2020)

Modelling the influences of technical surfaces on Phase Measuring Deflectometry

S. K. Patra, J. Bartsch, M. Kalms, R. B. Bergmann