Marek Smid

Tschechisches Metrologisches Institut, Czech Metrology Institute

1 paper

P28 · Poster · 117. Conference (2016)

Calibration of Si-SPAD detectors using the double attenuator technique and a low noise silicon photodiode

M. López, G. Porrovecchio, H. Hofer, B. Rodiek, M. Smid, S. Kück