Sven Teichert
Physikalisch-Technische Bundesanstalt, Physikalisch-Technische Bundesanstalt (German National Metrology Institute)
3 papers
P26 · Poster · 121. Conference (2020)
Analysis of ellipsometric layer thickness measurements applying a novel optimization method for depolarizing Mueller matrices
P10 · Poster · 120. Conference (2019)
A new method to derive best-fit parameters and their uncertainties from depolarizing Mueller-matrices
B20 · Talk · 114. Conference (2013)