Tobias Klein

BIAS - Bremer Institut für angewandte Strahltechnik GmbH, Bremen Institute for Applied Beam Technology
Physikalisch-Technische Bundesanstalt, Physikalisch-Technische Bundesanstalt (German National Metrology Institute)

2 papers

A29 · Talk · 119. Conference (2018)

Improved reconstruction quality of holographic projections by controlling the individual pixel shape

F. Thiemicke, T. Klein, R. B. Bergmann, C. Falldorf
P43 · Poster · 113. Conference (2012)

Traceable measurement of nanoparticle size using transmission scanning electron microscopy (TSEM)

E. Buhr, T. Klein, D. Bergmann, C. G. Frase