Sven van Haver

Optics Research Group, Delft University of Technology

1 paper

B34 · Talk · 113. Conference (2012)

Experimental Validation of the Extended-Nijboer-Zernike (ENZ) based Aberration Retrieval Method for Microscope Objectives

A. Wiegmann, S. van Haver, N. Kumar, S. F. Pereira