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Proceedings
ISSN 1614-8436
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Sai Gao
Sai Gao
Physikalisch-Technische Bundesanstalt, Physikalisch-Technische Bundesanstalt (German National Metrology Institute)
1 paper
B42 · Talk · 126. Conference (2025)
Comparison of a rigorous confocal microscope model with real measurements on a 1D grid
S. Wyss, B. Bodermann, S. Gao, L. Fu, S. Reichelt